[v3] test: reduce test duration for efd autotest

  Reduced test time for efd_autotest.
Key length is updated, invoke times of random function is reduced.
Different value is updated for each hash key entry.

Signed-off-by: Jananee Parthasarathy <jananeex.m.parthasarathy@intel.com>
---
v3: reverted the simple_key to uint8_t type
v2: value updated for each hash key
---
 test/test/test_efd.c | 18 ++++++++----------
 1 file changed, 8 insertions(+), 10 deletions(-)
  

Any review please?

29/11/2018 08:36, Jananee Parthasarathy:
> Reduced test time for efd_autotest.
> Key length is updated, invoke times of random function is reduced.
> Different value is updated for each hash key entry.
> 
> Signed-off-by: Jananee Parthasarathy <jananeex.m.parthasarathy@intel.com>
> ---
> v3: reverted the simple_key to uint8_t type
> v2: value updated for each hash key
> ---
>  test/test/test_efd.c | 18 ++++++++----------
>  1 file changed, 8 insertions(+), 10 deletions(-)
> 
> diff --git a/test/test/test_efd.c b/test/test/test_efd.c
> index ced091aab..94b490fdc 100644
> --- a/test/test/test_efd.c
> +++ b/test/test/test_efd.c
> @@ -12,7 +12,6 @@
>  
>  #include "test.h"
>  
> -#define EFD_TEST_KEY_LEN 8
>  #define TABLE_SIZE (1 << 21)
>  #define ITERATIONS 3
>  
> @@ -331,8 +330,9 @@ static int test_average_table_utilization(void)
>  {
>  	struct rte_efd_table *handle = NULL;
>  	uint32_t num_rules_in = TABLE_SIZE;
> -	uint8_t simple_key[EFD_TEST_KEY_LEN];
> -	unsigned int i, j;
> +	uint8_t  simple_key;
> +	unsigned int j;
> +	efd_value_t val;
>  	unsigned int added_keys, average_keys_added = 0;
>  
>  	printf("Evaluating table utilization and correctness, please wait\n");
> @@ -340,7 +340,7 @@ static int test_average_table_utilization(void)
>  
>  	for (j = 0; j < ITERATIONS; j++) {
>  		handle = rte_efd_create("test_efd", num_rules_in,
> -				EFD_TEST_KEY_LEN, efd_get_all_sockets_bitmask(),
> +				sizeof(uint8_t), efd_get_all_sockets_bitmask(),
>  				test_socket_id);
>  		if (handle == NULL) {
>  			printf("efd table creation failed\n");
> @@ -353,15 +353,13 @@ static int test_average_table_utilization(void)
>  		/* Add random entries until key cannot be added */
>  		for (added_keys = 0; added_keys < num_rules_in; added_keys++) {
>  
> -			for (i = 0; i < EFD_TEST_KEY_LEN; i++)
> -				simple_key[i] = rte_rand() & 0xFF;
> +			simple_key = rte_rand() & 0xFF;
> +			val = mrand48() & VALUE_BITMASK;
>  
> -			efd_value_t val = simple_key[0];
> -
> -			if (rte_efd_update(handle, test_socket_id, simple_key,
> +			if (rte_efd_update(handle, test_socket_id, &simple_key,
>  						val))
>  				break; /* continue;*/
> -			if (rte_efd_lookup(handle, test_socket_id, simple_key)
> +			if (rte_efd_lookup(handle, test_socket_id, &simple_key)
>  					!= val)
>  				lost_keys++;
>  			else
>
  

Still no review for this patch?

20/01/2019 22:25, Thomas Monjalon:
> Any review please?
> 
> 29/11/2018 08:36, Jananee Parthasarathy:
> > Reduced test time for efd_autotest.
> > Key length is updated, invoke times of random function is reduced.
> > Different value is updated for each hash key entry.
> > 
> > Signed-off-by: Jananee Parthasarathy <jananeex.m.parthasarathy@intel.com>
  

Hi,

>-----Original Message-----
>From: Thomas Monjalon [mailto:thomas@monjalon.net]
>Sent: Friday, July 05, 2019 3:17 AM
>To: dev@dpdk.org
>Cc: Parthasarathy, JananeeX M <jananeex.m.parthasarathy@intel.com>;
>Marohn, Byron <byron.marohn@intel.com>; De Lara Guarch, Pablo
><pablo.de.lara.guarch@intel.com>; Pattan, Reshma
><reshma.pattan@intel.com>; david.marchand@redhat.com;
>aconole@redhat.com
>Subject: Re: [dpdk-dev] [PATCH v3] test: reduce test duration for efd autotest
>
>Still no review for this patch?
>
>20/01/2019 22:25, Thomas Monjalon:
>> Any review please?
>>
>> 29/11/2018 08:36, Jananee Parthasarathy:
>> > Reduced test time for efd_autotest.
>> > Key length is updated, invoke times of random function is reduced.
>> > Different value is updated for each hash key entry.
>> >
>> > Signed-off-by: Jananee Parthasarathy
><jananeex.m.parthasarathy@intel.com>
>
>
>
Self NACK.
Although this patch reduces test duration it reduces the number of combinations which is not useful.
Hence as per discussion with Maintainer, this patch can be ignored.

Regards
M.P.Jananee