[v3] test: reduce test duration for efd autotest

Message ID 1543476964-20344-1-git-send-email-jananeex.m.parthasarathy@intel.com
State Rejected, archived
Delegated to: Thomas Monjalon
Headers show
Series
  • [v3] test: reduce test duration for efd autotest
Related show

Checks

Context Check Description
ci/intel-Performance-Testing success Performance Testing PASS
ci/mellanox-Performance-Testing success Performance Testing PASS
ci/Intel-compilation success Compilation OK
ci/checkpatch success coding style OK

Commit Message

Jananee Parthasarathy Nov. 29, 2018, 7:36 a.m.
Reduced test time for efd_autotest.
Key length is updated, invoke times of random function is reduced.
Different value is updated for each hash key entry.

Signed-off-by: Jananee Parthasarathy <jananeex.m.parthasarathy@intel.com>
---
v3: reverted the simple_key to uint8_t type
v2: value updated for each hash key
---
 test/test/test_efd.c | 18 ++++++++----------
 1 file changed, 8 insertions(+), 10 deletions(-)

Comments

Thomas Monjalon Jan. 20, 2019, 9:25 p.m. | #1
Any review please?

29/11/2018 08:36, Jananee Parthasarathy:
> Reduced test time for efd_autotest.
> Key length is updated, invoke times of random function is reduced.
> Different value is updated for each hash key entry.
> 
> Signed-off-by: Jananee Parthasarathy <jananeex.m.parthasarathy@intel.com>
> ---
> v3: reverted the simple_key to uint8_t type
> v2: value updated for each hash key
> ---
>  test/test/test_efd.c | 18 ++++++++----------
>  1 file changed, 8 insertions(+), 10 deletions(-)
> 
> diff --git a/test/test/test_efd.c b/test/test/test_efd.c
> index ced091aab..94b490fdc 100644
> --- a/test/test/test_efd.c
> +++ b/test/test/test_efd.c
> @@ -12,7 +12,6 @@
>  
>  #include "test.h"
>  
> -#define EFD_TEST_KEY_LEN 8
>  #define TABLE_SIZE (1 << 21)
>  #define ITERATIONS 3
>  
> @@ -331,8 +330,9 @@ static int test_average_table_utilization(void)
>  {
>  	struct rte_efd_table *handle = NULL;
>  	uint32_t num_rules_in = TABLE_SIZE;
> -	uint8_t simple_key[EFD_TEST_KEY_LEN];
> -	unsigned int i, j;
> +	uint8_t  simple_key;
> +	unsigned int j;
> +	efd_value_t val;
>  	unsigned int added_keys, average_keys_added = 0;
>  
>  	printf("Evaluating table utilization and correctness, please wait\n");
> @@ -340,7 +340,7 @@ static int test_average_table_utilization(void)
>  
>  	for (j = 0; j < ITERATIONS; j++) {
>  		handle = rte_efd_create("test_efd", num_rules_in,
> -				EFD_TEST_KEY_LEN, efd_get_all_sockets_bitmask(),
> +				sizeof(uint8_t), efd_get_all_sockets_bitmask(),
>  				test_socket_id);
>  		if (handle == NULL) {
>  			printf("efd table creation failed\n");
> @@ -353,15 +353,13 @@ static int test_average_table_utilization(void)
>  		/* Add random entries until key cannot be added */
>  		for (added_keys = 0; added_keys < num_rules_in; added_keys++) {
>  
> -			for (i = 0; i < EFD_TEST_KEY_LEN; i++)
> -				simple_key[i] = rte_rand() & 0xFF;
> +			simple_key = rte_rand() & 0xFF;
> +			val = mrand48() & VALUE_BITMASK;
>  
> -			efd_value_t val = simple_key[0];
> -
> -			if (rte_efd_update(handle, test_socket_id, simple_key,
> +			if (rte_efd_update(handle, test_socket_id, &simple_key,
>  						val))
>  				break; /* continue;*/
> -			if (rte_efd_lookup(handle, test_socket_id, simple_key)
> +			if (rte_efd_lookup(handle, test_socket_id, &simple_key)
>  					!= val)
>  				lost_keys++;
>  			else
>
Thomas Monjalon July 4, 2019, 9:46 p.m. | #2
Still no review for this patch?

20/01/2019 22:25, Thomas Monjalon:
> Any review please?
> 
> 29/11/2018 08:36, Jananee Parthasarathy:
> > Reduced test time for efd_autotest.
> > Key length is updated, invoke times of random function is reduced.
> > Different value is updated for each hash key entry.
> > 
> > Signed-off-by: Jananee Parthasarathy <jananeex.m.parthasarathy@intel.com>
Jananee Parthasarathy July 19, 2019, 9:01 a.m. | #3
Hi,

>-----Original Message-----
>From: Thomas Monjalon [mailto:thomas@monjalon.net]
>Sent: Friday, July 05, 2019 3:17 AM
>To: dev@dpdk.org
>Cc: Parthasarathy, JananeeX M <jananeex.m.parthasarathy@intel.com>;
>Marohn, Byron <byron.marohn@intel.com>; De Lara Guarch, Pablo
><pablo.de.lara.guarch@intel.com>; Pattan, Reshma
><reshma.pattan@intel.com>; david.marchand@redhat.com;
>aconole@redhat.com
>Subject: Re: [dpdk-dev] [PATCH v3] test: reduce test duration for efd autotest
>
>Still no review for this patch?
>
>20/01/2019 22:25, Thomas Monjalon:
>> Any review please?
>>
>> 29/11/2018 08:36, Jananee Parthasarathy:
>> > Reduced test time for efd_autotest.
>> > Key length is updated, invoke times of random function is reduced.
>> > Different value is updated for each hash key entry.
>> >
>> > Signed-off-by: Jananee Parthasarathy
><jananeex.m.parthasarathy@intel.com>
>
>
>
Self NACK.
Although this patch reduces test duration it reduces the number of combinations which is not useful.
Hence as per discussion with Maintainer, this patch can be ignored.

Regards
M.P.Jananee

Patch

diff --git a/test/test/test_efd.c b/test/test/test_efd.c
index ced091aab..94b490fdc 100644
--- a/test/test/test_efd.c
+++ b/test/test/test_efd.c
@@ -12,7 +12,6 @@ 
 
 #include "test.h"
 
-#define EFD_TEST_KEY_LEN 8
 #define TABLE_SIZE (1 << 21)
 #define ITERATIONS 3
 
@@ -331,8 +330,9 @@  static int test_average_table_utilization(void)
 {
 	struct rte_efd_table *handle = NULL;
 	uint32_t num_rules_in = TABLE_SIZE;
-	uint8_t simple_key[EFD_TEST_KEY_LEN];
-	unsigned int i, j;
+	uint8_t  simple_key;
+	unsigned int j;
+	efd_value_t val;
 	unsigned int added_keys, average_keys_added = 0;
 
 	printf("Evaluating table utilization and correctness, please wait\n");
@@ -340,7 +340,7 @@  static int test_average_table_utilization(void)
 
 	for (j = 0; j < ITERATIONS; j++) {
 		handle = rte_efd_create("test_efd", num_rules_in,
-				EFD_TEST_KEY_LEN, efd_get_all_sockets_bitmask(),
+				sizeof(uint8_t), efd_get_all_sockets_bitmask(),
 				test_socket_id);
 		if (handle == NULL) {
 			printf("efd table creation failed\n");
@@ -353,15 +353,13 @@  static int test_average_table_utilization(void)
 		/* Add random entries until key cannot be added */
 		for (added_keys = 0; added_keys < num_rules_in; added_keys++) {
 
-			for (i = 0; i < EFD_TEST_KEY_LEN; i++)
-				simple_key[i] = rte_rand() & 0xFF;
+			simple_key = rte_rand() & 0xFF;
+			val = mrand48() & VALUE_BITMASK;
 
-			efd_value_t val = simple_key[0];
-
-			if (rte_efd_update(handle, test_socket_id, simple_key,
+			if (rte_efd_update(handle, test_socket_id, &simple_key,
 						val))
 				break; /* continue;*/
-			if (rte_efd_lookup(handle, test_socket_id, simple_key)
+			if (rte_efd_lookup(handle, test_socket_id, &simple_key)
 					!= val)
 				lost_keys++;
 			else