[v2,1/2] test/ring: add stress test for ST peek API
diff mbox series

Message ID 20200702141027.18447-2-konstantin.ananyev@intel.com
State Accepted
Delegated to: David Marchand
Headers show
Series
  • extend test coverage for ring PEEK API
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Checks

Context Check Description
ci/Intel-compilation fail apply issues
ci/iol-testing success Testing PASS
ci/iol-mellanox-Performance success Performance Testing PASS
ci/iol-intel-Performance success Performance Testing PASS
ci/iol-broadcom-Performance success Performance Testing PASS
ci/checkpatch success coding style OK

Commit Message

Ananyev, Konstantin July 2, 2020, 2:10 p.m. UTC
Introduce new test case to test ST peek API.

Signed-off-by: Konstantin Ananyev <konstantin.ananyev@intel.com>
---
 app/test/Makefile                   |  1 +
 app/test/meson.build                |  1 +
 app/test/test_ring_st_peek_stress.c | 54 +++++++++++++++++++++++++++++
 app/test/test_ring_stress.c         |  3 ++
 app/test/test_ring_stress.h         |  1 +
 5 files changed, 60 insertions(+)
 create mode 100644 app/test/test_ring_st_peek_stress.c

Comments

Honnappa Nagarahalli July 2, 2020, 4:18 p.m. UTC | #1
> -----Original Message-----
> From: Konstantin Ananyev <konstantin.ananyev@intel.com>
> Sent: Thursday, July 2, 2020 9:10 AM
> To: dev@dpdk.org
> Cc: Honnappa Nagarahalli <Honnappa.Nagarahalli@arm.com>; Feifei Wang
> <Feifei.Wang2@arm.com>; Konstantin Ananyev
> <konstantin.ananyev@intel.com>
> Subject: [PATCH v2 1/2] test/ring: add stress test for ST peek API
> 
> Introduce new test case to test ST peek API.
> 
> Signed-off-by: Konstantin Ananyev <konstantin.ananyev@intel.com>
Reviewed-by: Honnappa Nagarahalli <honnappa.nagarahalli@arm.com>

> ---
>  app/test/Makefile                   |  1 +
>  app/test/meson.build                |  1 +
>  app/test/test_ring_st_peek_stress.c | 54 +++++++++++++++++++++++++++++
>  app/test/test_ring_stress.c         |  3 ++
>  app/test/test_ring_stress.h         |  1 +
>  5 files changed, 60 insertions(+)
>  create mode 100644 app/test/test_ring_st_peek_stress.c
> 
> diff --git a/app/test/Makefile b/app/test/Makefile index
> 7b96a03a6..37bdaf891 100644
> --- a/app/test/Makefile
> +++ b/app/test/Makefile
> @@ -83,6 +83,7 @@ SRCS-y += test_ring_hts_stress.c  SRCS-y +=
> test_ring_perf.c  SRCS-y += test_ring_peek_stress.c  SRCS-y +=
> test_ring_rts_stress.c
> +SRCS-y += test_ring_st_peek_stress.c
>  SRCS-y += test_ring_stress.c
>  SRCS-y += test_pmd_perf.c
> 
> diff --git a/app/test/meson.build b/app/test/meson.build index
> b224d6f2b..5cb050958 100644
> --- a/app/test/meson.build
> +++ b/app/test/meson.build
> @@ -108,6 +108,7 @@ test_sources = files('commands.c',
>  	'test_ring_peek_stress.c',
>  	'test_ring_perf.c',
>  	'test_ring_rts_stress.c',
> +	'test_ring_st_peek_stress.c',
>  	'test_ring_stress.c',
>  	'test_rwlock.c',
>  	'test_sched.c',
> diff --git a/app/test/test_ring_st_peek_stress.c
> b/app/test/test_ring_st_peek_stress.c
> new file mode 100644
> index 000000000..bc573de47
> --- /dev/null
> +++ b/app/test/test_ring_st_peek_stress.c
> @@ -0,0 +1,54 @@
> +/* SPDX-License-Identifier: BSD-3-Clause
> + * Copyright(c) 2020 Intel Corporation
> + */
> +
> +#include "test_ring_stress_impl.h"
> +#include <rte_ring_elem.h>
> +
> +static inline uint32_t
> +_st_ring_dequeue_bulk(struct rte_ring *r, void **obj, uint32_t n,
> +	uint32_t *avail)
> +{
> +	uint32_t m;
> +
> +	static rte_spinlock_t lck = RTE_SPINLOCK_INITIALIZER;
> +
> +	rte_spinlock_lock(&lck);
> +
> +	m = rte_ring_dequeue_bulk_start(r, obj, n, avail);
> +	n = (m == n) ? n : 0;
> +	rte_ring_dequeue_finish(r, n);
> +
> +	rte_spinlock_unlock(&lck);
> +	return n;
> +}
> +
> +static inline uint32_t
> +_st_ring_enqueue_bulk(struct rte_ring *r, void * const *obj, uint32_t n,
> +	uint32_t *free)
> +{
> +	uint32_t m;
> +
> +	static rte_spinlock_t lck = RTE_SPINLOCK_INITIALIZER;
> +
> +	rte_spinlock_lock(&lck);
> +
> +	m = rte_ring_enqueue_bulk_start(r, n, free);
> +	n = (m == n) ? n : 0;
> +	rte_ring_enqueue_finish(r, obj, n);
> +
> +	rte_spinlock_unlock(&lck);
> +	return n;
> +}
> +
> +static int
> +_st_ring_init(struct rte_ring *r, const char *name, uint32_t num) {
> +	return rte_ring_init(r, name, num, RING_F_SP_ENQ |
> RING_F_SC_DEQ); }
> +
> +const struct test test_ring_st_peek_stress = {
> +	.name = "ST_PEEK",
> +	.nb_case = RTE_DIM(tests),
> +	.cases = tests,
> +};
> diff --git a/app/test/test_ring_stress.c b/app/test/test_ring_stress.c index
> 853fcc190..387cfa747 100644
> --- a/app/test/test_ring_stress.c
> +++ b/app/test/test_ring_stress.c
> @@ -49,6 +49,9 @@ test_ring_stress(void)
>  	n += test_ring_peek_stress.nb_case;
>  	k += run_test(&test_ring_peek_stress);
> 
> +	n += test_ring_st_peek_stress.nb_case;
> +	k += run_test(&test_ring_st_peek_stress);
> +
>  	printf("Number of tests:\t%u\nSuccess:\t%u\nFailed:\t%u\n",
>  		n, k, n - k);
>  	return (k != n);
> diff --git a/app/test/test_ring_stress.h b/app/test/test_ring_stress.h index
> 60953ce47..a9a390341 100644
> --- a/app/test/test_ring_stress.h
> +++ b/app/test/test_ring_stress.h
> @@ -36,3 +36,4 @@ extern const struct test test_ring_mpmc_stress;  extern
> const struct test test_ring_rts_stress;  extern const struct test
> test_ring_hts_stress;  extern const struct test test_ring_peek_stress;
> +extern const struct test test_ring_st_peek_stress;
> --
> 2.17.1

Patch
diff mbox series

diff --git a/app/test/Makefile b/app/test/Makefile
index 7b96a03a6..37bdaf891 100644
--- a/app/test/Makefile
+++ b/app/test/Makefile
@@ -83,6 +83,7 @@  SRCS-y += test_ring_hts_stress.c
 SRCS-y += test_ring_perf.c
 SRCS-y += test_ring_peek_stress.c
 SRCS-y += test_ring_rts_stress.c
+SRCS-y += test_ring_st_peek_stress.c
 SRCS-y += test_ring_stress.c
 SRCS-y += test_pmd_perf.c
 
diff --git a/app/test/meson.build b/app/test/meson.build
index b224d6f2b..5cb050958 100644
--- a/app/test/meson.build
+++ b/app/test/meson.build
@@ -108,6 +108,7 @@  test_sources = files('commands.c',
 	'test_ring_peek_stress.c',
 	'test_ring_perf.c',
 	'test_ring_rts_stress.c',
+	'test_ring_st_peek_stress.c',
 	'test_ring_stress.c',
 	'test_rwlock.c',
 	'test_sched.c',
diff --git a/app/test/test_ring_st_peek_stress.c b/app/test/test_ring_st_peek_stress.c
new file mode 100644
index 000000000..bc573de47
--- /dev/null
+++ b/app/test/test_ring_st_peek_stress.c
@@ -0,0 +1,54 @@ 
+/* SPDX-License-Identifier: BSD-3-Clause
+ * Copyright(c) 2020 Intel Corporation
+ */
+
+#include "test_ring_stress_impl.h"
+#include <rte_ring_elem.h>
+
+static inline uint32_t
+_st_ring_dequeue_bulk(struct rte_ring *r, void **obj, uint32_t n,
+	uint32_t *avail)
+{
+	uint32_t m;
+
+	static rte_spinlock_t lck = RTE_SPINLOCK_INITIALIZER;
+
+	rte_spinlock_lock(&lck);
+
+	m = rte_ring_dequeue_bulk_start(r, obj, n, avail);
+	n = (m == n) ? n : 0;
+	rte_ring_dequeue_finish(r, n);
+
+	rte_spinlock_unlock(&lck);
+	return n;
+}
+
+static inline uint32_t
+_st_ring_enqueue_bulk(struct rte_ring *r, void * const *obj, uint32_t n,
+	uint32_t *free)
+{
+	uint32_t m;
+
+	static rte_spinlock_t lck = RTE_SPINLOCK_INITIALIZER;
+
+	rte_spinlock_lock(&lck);
+
+	m = rte_ring_enqueue_bulk_start(r, n, free);
+	n = (m == n) ? n : 0;
+	rte_ring_enqueue_finish(r, obj, n);
+
+	rte_spinlock_unlock(&lck);
+	return n;
+}
+
+static int
+_st_ring_init(struct rte_ring *r, const char *name, uint32_t num)
+{
+	return rte_ring_init(r, name, num, RING_F_SP_ENQ | RING_F_SC_DEQ);
+}
+
+const struct test test_ring_st_peek_stress = {
+	.name = "ST_PEEK",
+	.nb_case = RTE_DIM(tests),
+	.cases = tests,
+};
diff --git a/app/test/test_ring_stress.c b/app/test/test_ring_stress.c
index 853fcc190..387cfa747 100644
--- a/app/test/test_ring_stress.c
+++ b/app/test/test_ring_stress.c
@@ -49,6 +49,9 @@  test_ring_stress(void)
 	n += test_ring_peek_stress.nb_case;
 	k += run_test(&test_ring_peek_stress);
 
+	n += test_ring_st_peek_stress.nb_case;
+	k += run_test(&test_ring_st_peek_stress);
+
 	printf("Number of tests:\t%u\nSuccess:\t%u\nFailed:\t%u\n",
 		n, k, n - k);
 	return (k != n);
diff --git a/app/test/test_ring_stress.h b/app/test/test_ring_stress.h
index 60953ce47..a9a390341 100644
--- a/app/test/test_ring_stress.h
+++ b/app/test/test_ring_stress.h
@@ -36,3 +36,4 @@  extern const struct test test_ring_mpmc_stress;
 extern const struct test test_ring_rts_stress;
 extern const struct test test_ring_hts_stress;
 extern const struct test test_ring_peek_stress;
+extern const struct test test_ring_st_peek_stress;