diff mbox series

[v4,4/4] test: change external memory test to use system page sz

Message ID 20201202054647.3449-5-ndabilpuram@marvell.com (mailing list archive)
State Superseded, archived
Delegated to: David Marchand
Headers
Series fix issue with partial DMA unmap |

Checks

Context Check Description
ci/checkpatch success coding style OK
ci/Intel-compilation success Compilation OK
ci/iol-broadcom-Performance success Performance Testing PASS
ci/iol-broadcom-Functional success Functional Testing PASS
ci/iol-testing success Testing PASS
ci/iol-intel-Functional success Functional Testing PASS
ci/iol-intel-Performance success Performance Testing PASS
ci/travis-robot success Travis build: passed

Commit Message

Nithin Dabilpuram Dec. 2, 2020, 5:46 a.m. UTC 
  Currently external memory test uses 4K page size.
VFIO DMA mapping works only with system page granularity.

Earlier it was working because all the contiguous mappings
were coalesced and mapped in one-go which ended up becoming
a lot bigger page. Now that VFIO DMA mappings both in IOVA as VA
and IOVA as PA mode, are being done at memseg list granularity,
we need to use system page size.

Signed-off-by: Nithin Dabilpuram <ndabilpuram@marvell.com>
---
 app/test/test_external_mem.c | 3 ++-
 1 file changed, 2 insertions(+), 1 deletion(-)
diff mbox series

Patch

diff --git a/app/test/test_external_mem.c b/app/test/test_external_mem.c
index 7eb81f6..5edf88b 100644
--- a/app/test/test_external_mem.c
+++ b/app/test/test_external_mem.c
@@ -13,6 +13,7 @@ 
 #include <rte_common.h>
 #include <rte_debug.h>
 #include <rte_eal.h>
+#include <rte_eal_paging.h>
 #include <rte_errno.h>
 #include <rte_malloc.h>
 #include <rte_ring.h>
@@ -532,8 +533,8 @@  test_extmem_basic(void *addr, size_t len, size_t pgsz, rte_iova_t *iova,
 static int
 test_external_mem(void)
 {
+	size_t pgsz = rte_mem_page_size();
 	size_t len = EXTERNAL_MEM_SZ;
-	size_t pgsz = RTE_PGSIZE_4K;
 	rte_iova_t iova[len / pgsz];
 	void *addr;
 	int ret, n_pages;